This is the first of three videos documenting my AFM and progress in learning how to use it. The full blog post associated with these videos is here: http://41j.com/blog/2015/10/veeco-nanoscope-v-multimode-afm-first-imaging-tests/
When performing an AFM measurement one of the most important decisions made is the selection of the proper probe. This decision can make the difference between groundbreaking results or hours of lost time-to-data. When making a probe selection, one is faced with a cornucopia of options and this decision may feel daunting. In this webinar, the information and probe knowledge used by AFM experts to select a probe is presented. This webinar will begin with the role of the probe in an AFM measurement; covering the fundamentals of an AFM probe such as cantilever stiffness and frequency, probe shape and probe material and coatings. This is then followed by an in-depth, application specific presentation of probes for common experiments. Topics covered include probes for high resolution and high speed imaging; biological AFM, electrical AFM, nanomechanical AFM and Tip Enhanced Raman (TERS). Lastly, several methods for probe cleaning will be discussed. The webinar closes with a review of the Bruker AFM Probes website and probe selection guide.
The Dimension® Edge™ Atomic Force Microscope (AFM) System incorporates Bruker's latest technology advances to provide the highest levels of performance, functionality, and accessibility in its class. Based on the ultimate Dimension Icon® platform, the Edge System has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication ready data in minutes instead of hours, all at price points well below expectations for such performance. In addition, integrated visual feedback and preconfigured settings enable expert level results simply and consistently, making the most advanced large-sample atomic force microscopy capabilities and techniques available to every facility and user.
Watch our webinar to learn more about ScanAsyst and its underlying mode, PeakForce Tapping, as we reveal details of the technology and demonstrate its range of applications on the Dimension Edge AFM platform.
In this talk, we will discuss improvements to the contact geometry analysis for CR-AFM with examples on various materials. We will also examine new developments combining CR-AFM with force-controlled modes such as force volume and PeakForce tapping. This provides new insights for contact mechanics and also into the mechanics of contact formation and contact breaking. Finally, we will consider the effect of the time dependence of material properties on all of the measurements.
For further information: http://www.dme-spm.com/remafm.html The video shows in real time working with the DME BRR: Exact positioning the AFM tip and observing the surface from different angles while scanning.
For more detailed information about raw data, you can go to this video: https://www.youtube.com/watch?v=4dvCbigMYkQ&t=475s
John Thornton from Bruker shows us their Dimension Fastscan system. This is claimed to be the fastest scanning AFM on the market. It can operate in contact, tapping and peak force modes and scan at very fast rates without losing detail or resolution.
Dr. Chunzeng Li explains, in a simple manner, how AFM works and showcases some of the many things it can do. After touching on the evolution and revolution of the AFM technique itself, and the rich knowledge it has brought about through its widespread uses; we comment on some on-going and future trends. From this webinar you can gain a broader understanding of AFM and generate some new ideas about atomic force microscopy's potential contributions to your research or product development in 2014 and beyond.